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"Fine-grained characterization of process variation in FPGAs."

Haile Yu, Qiang Xu, Philip Heng Wai Leong (2010)

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DOI: 10.1109/FPT.2010.5681770

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-30

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  dblp key:
  - conf/fpt/YuXL10
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Haile Yu, Qiang Xu, Philip Heng Wai Leong:
Fine-grained characterization of process variation in FPGAs. FPT 2010: 138-145

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