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"A Divide-And-Conquer Approach to Test Generation for Large Synchronous ..."

Irith Pomeranz, Sudhakar M. Reddy (1992)

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DOI: 10.1109/FTCS.1992.243579

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Irith Pomeranz, Sudhakar M. Reddy:
A Divide-And-Conquer Approach to Test Generation for Large Synchronous Sequential Circuits. FTCS 1992: 230-237

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