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"Test Pattern Generation for Path Delay Faults in Synchronous Sequential ..."

Prasanti Uppaluri, Irith Pomeranz, Sudhakar M. Reddy (1994)

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DOI: 10.1109/FTCS.1994.315617

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Prasanti Uppaluri, Irith Pomeranz, Sudhakar M. Reddy:
Test Pattern Generation for Path Delay Faults in Synchronous Sequential Circuits Using Multiple Fast Clocks and Multiple Observations Times. FTCS 1994: 456-465

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