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"How an "Evolving" Fault Model Improves the Behavioral Test Generation."

Giacomo Buonanno et al. (1997)

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DOI: 10.1109/GLSV.1997.580515

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/glvlsi/BuonannoFFFS97
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  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/BuonannoFFFS97
Giacomo Buonanno, Fabrizio Ferrandi, L. Ferrandi, Franco Fummi, Donatella Sciuto:
How an "Evolving" Fault Model Improves the Behavioral Test Generation. Great Lakes Symposium on VLSI 1997: 124-

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