"Layout Characterization and Power Density Analysis for Shorted-Gate and ..."

Tiansong Cui et al. (2015)

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DOI: 10.1145/2742060.2742093

access: closed

type: Conference or Workshop Paper

metadata version: 2025-11-16

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Tiansong Cui, Bowen Chen, Yanzhi Wang, Shahin Nazarian, Massoud Pedram:
Layout Characterization and Power Density Analysis for Shorted-Gate and Independent-Gate 7nm FinFET Standard Cells. ACM Great Lakes Symposium on VLSI 2015: 33-38

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