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"Analysis and mitigation of NBTI-impact on PVT variability in repeated ..."

Basab Datta, Wayne P. Burleson (2010)

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DOI: 10.1145/1785481.1785559

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-06

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Basab Datta, Wayne P. Burleson:
Analysis and mitigation of NBTI-impact on PVT variability in repeated global interconnect performance. ACM Great Lakes Symposium on VLSI 2010: 341-346

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