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"SARO: A State-Aware Reliability Optimization Technique for High Density ..."

Myungsuk Kim et al. (2018)

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DOI: 10.1145/3194554.3194591

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-13

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Myungsuk Kim, Youngsun Song, Myoungsoo Jung, Jihong Kim:
SARO: A State-Aware Reliability Optimization Technique for High Density NAND Flash Memory. ACM Great Lakes Symposium on VLSI 2018: 255-260

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