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"On macro-fault: a new fault model, its implications on fault tolerance and ..."

Tak-Kei Lam et al. (2014)

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DOI: 10.1145/2591513.2591556

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Tak-Kei Lam, Xing Wei, Wen-Ben Jone, Yi Diao, Yu-Liang Wu:
On macro-fault: a new fault model, its implications on fault tolerance and manufacturing yield. ACM Great Lakes Symposium on VLSI 2014: 233-234

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