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"Using adaptive read voltage thresholds to enhance the reliability of MLC ..."

Nikolaos Papandreou et al. (2014)

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DOI: 10.1145/2591513.2591594

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Nikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary A. Tressler, Andrew Walls:
Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systems. ACM Great Lakes Symposium on VLSI 2014: 151-156

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