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"An Effective Test Method for Block RAMs in Heterogeneous FPGAs Based on a ..."

Wei Xiong et al. (2022)

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DOI: 10.1145/3526241.3530317

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-15

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  - https://dblp.org/rec/conf/glvlsi/XiongLSLLWLQ22
Wei Xiong, Yanze Li, Changpeng Sun, Huanlin Luo, Jiafeng Liu, Jian Wang, Jinmei Lai, Gang Qu:
An Effective Test Method for Block RAMs in Heterogeneous FPGAs Based on a Novel Partial Bitstream Relocation Technique. ACM Great Lakes Symposium on VLSI 2022: 275-280

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