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"STAT: Mean and Variance Characterization for Robust Inference of DNNs on ..."

Baogang Zhang, Necati Uysal, Rickard Ewetz (2019)

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DOI: 10.1145/3299874.3318032

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Baogang Zhang, Necati Uysal, Rickard Ewetz:
STAT: Mean and Variance Characterization for Robust Inference of DNNs on Memristor-based Platforms. ACM Great Lakes Symposium on VLSI 2019: 339-342

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