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"A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and ..."

Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka (2016)

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DOI: 10.1109/HPCC-SMARTCITY-DSS.2016.0081

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/hpcc/BhowmikBD16
Biswajit Bhowmik, Santosh Biswas, Jatindra Kumar Deka:
A Reliability-Aware Topology-Agnostic Test Scheme for Detecting, and Diagnosing Interconnect Shorts in On-chip Networks. HPCC/SmartCity/DSS 2016: 530-537

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