"Enhanced Active Learning of Convolutional Neural Networks: A Case Study ..."

Georgios Koutroulis et al. (2020)

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DOI: 10.5220/0010142902690276

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Georgios Koutroulis, Tiago Santos, Michael Wiedemann, Christian Faistauer, Roman Kern, Stefan Thalmann:
Enhanced Active Learning of Convolutional Neural Networks: A Case Study for Defect Classification in the Semiconductor Industry. KDIR 2020: 269-276

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