"Test challenges in designing complex 3D chips: What in on the horizon for ..."

Sandeep Kumar Goel (2012)

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DOI: 10.1145/2429384.2429438

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-09

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Sandeep Kumar Goel:
Test challenges in designing complex 3D chips: What in on the horizon for EDA industry?: Designer track. ICCAD 2012: 273

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