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"Test Generation for Acyclic Sequential Circuits with Hold Registers."
Tomoo Inoue et al. (2000)
- Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara:
Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556
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