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ORCID"An electrothermally-aware full-chip substrate temperature gradient ..."
Sheng-Chih Lin, Kaustav Banerjee (2006)
- Sheng-Chih Lin, Kaustav Banerjee:
An electrothermally-aware full-chip substrate temperature gradient evaluation methodology for leakage dominant technologies with implications for power estimation and hot-spot management. ICCAD 2006: 568-574
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