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ORCID"Fast Generation of Statistically-based Worst-Case Modeling of On-Chip ..."
Norman Chang et al. (1997)
- Norman Chang, Valery Kanevsky, O. Sam Nakagawa, Khalid Rahmat, Soo-Young Oh:
Fast Generation of Statistically-based Worst-Case Modeling of On-Chip Interconnect. ICCD 1997: 720-725
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