"Digital and analog integrated-circuit design with built-in reliability."

Wen-Jay Hsu, Bing J. Sheu, Vance C. Tyree (1989)

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DOI: 10.1109/ICCD.1989.63416

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Wen-Jay Hsu, Bing J. Sheu, Vance C. Tyree:
Digital and analog integrated-circuit design with built-in reliability. ICCD 1989: 496-499

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