"Test points selection process and diagnosability analysis of analog ..."

Wei-Hsing Huang, Chin-Long Wey (1998)

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DOI: 10.1109/ICCD.1998.727113

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Wei-Hsing Huang, Chin-Long Wey:
Test points selection process and diagnosability analysis of analog integrated circuits. ICCD 1998: 582-587

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