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"Steady and Transient State Analysis of Gate Leakage Current in Nanoscale ..."

Saraju P. Mohanty, Elias Kougianos (2006)

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DOI: 10.1109/ICCD.2006.4380819

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Saraju P. Mohanty, Elias Kougianos:
Steady and Transient State Analysis of Gate Leakage Current in Nanoscale CMOS Logic Gates. ICCD 2006: 210-215

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