"Verification of Timed Circuits with Failure Directed Abstractions."

Hao Zheng et al. (2003)

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DOI: 10.1109/ICCD.2003.1240869

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hao Zheng, Chris J. Myers, David Walter, Scott Little, Tomohiro Yoneda:
Verification of Timed Circuits with Failure Directed Abstractions. ICCD 2003: 28-35

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