"ESD-Immunity Impact of HV pLDMOS with Drain-side Embedded Horizontal ..."

Shi-Zhe Hong et al. (2021)

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DOI: 10.1109/ICCE-TW52618.2021.9602957

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-23

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Shi-Zhe Hong, Shen-Li Chen, Tien-Yu Lan, Yu-Jie Zhou, Zhi-Wei Liu, Jhong-Yi Lai:
ESD-Immunity Impact of HV pLDMOS with Drain-side Embedded Horizontal P-type Schottky Modulations. ICCE-TW 2021: 1-2

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