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"A fully integrated Phase-locked loop with leakage current compensation in ..."

Se-Chun Park, Seung-Baek Park, Soo-Won Kim (2015)

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DOI: 10.1109/ICCE.2015.7066538

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-02

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Se-Chun Park, Seung-Baek Park, Soo-Won Kim:
A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology. ICCE 2015: 587-588

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