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"Automatic Test Case Generation for Vulnerability Analysis of Galois Field ..."

Krishn Kumar Gupt et al. (2021)

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DOI: 10.1109/CSP51677.2021.9357567

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Krishn Kumar Gupt, Meghana Kshirsagar, Joseph P. Sullivan, Conor Ryan:
Automatic Test Case Generation for Vulnerability Analysis of Galois Field Arithmetic Circuits. CSP 2021: 32-37

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