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"New Analog Test Metrics Based on Probabilistic and Deterministic ..."
Abdessatar Abderrahman et al. (2007)
- Abdessatar Abderrahman, Mohamad Sawan, Yvon Savaria, Abdelhakim Khouas:
New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches. ICECS 2007: 82-85
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