"Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event ..."

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis (2015)

Details and statistics

DOI: 10.1109/ICECS.2015.7440267

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-22

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