"Non-robust delay test pattern generation based on stuck-at TPG."

Volker Meyer, Walter Anheier, Arne Sticht (2001)

> Home

Details and statistics

DOI: 10.1109/ICECS.2001.957645

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icecsys/MeyerAS01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icecsys/MeyerAS01
Volker Meyer, Walter Anheier, Arne Sticht:
Non-robust delay test pattern generation based on stuck-at TPG. ICECS 2001: 1007-1010

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.