"Static Noise Margin in 16 nm FinFET 6T and 8T SRAM Cells for ..."

Lorenzo Stevenazzi, Andrea Baschirotto, Marcello De Matteis (2023)

Details and statistics

DOI: 10.1109/ICECS58634.2023.10382712

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-18