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"Systematic Study on Positive Bias Temperature Instability(PBTI) of ..."

Lulu Chou et al. (2022)

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DOI: 10.1109/ICICDT56182.2022.9933130

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-16

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  - conf/icicdt/ChouYLLHH22
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  - https://dblp.org/rec/conf/icicdt/ChouYLLHH22
Lulu Chou, Xiao Yu, Huan Liu, Yan Liu, Genquan Han, Yue Hao:
Systematic Study on Positive Bias Temperature Instability(PBTI) of ZrO2-based Ge nMOSFETs with Interlayer Passivations. ICICDT 2022: 12-15

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