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"Electrical characterization of process induced effects on non-silicon devices."

Chadwin D. Young et al. (2018)

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DOI: 10.1109/ICICDT.2018.8399784

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/icicdt/YoungBRZKMQHW18
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  - https://dblp.org/rec/conf/icicdt/YoungBRZKMQHW18
Chadwin D. Young, Pavel Bolshakov, Rodolfo A. Rodriguez-Davila, Peng Zhao, Ava Khosravi, Israel Mejia, Manuel Quevedo-Lopez, Christopher L. Hinkle, Robert M. Wallace:
Electrical characterization of process induced effects on non-silicon devices. ICICDT 2018: 173-176

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