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"Degradation in P-type Poly-Si Thin-Film Transistors under Pulse Bias Stresses."

Yining Yu et al. (2019)

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DOI: 10.1109/ICICDT.2019.8790887

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-18

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  dblp key:
  - conf/icicdt/YuZWW19
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  - https://dblp.org/rec/conf/icicdt/YuZWW19
Yining Yu, Dongli Zhang, Mingxiang Wang, Huaisheng Wang:
Degradation in P-type Poly-Si Thin-Film Transistors under Pulse Bias Stresses. ICICDT 2019: 1-4

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