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"Depth Measurement Using Frequency Analysis with an Active Projection."

Sangkeun Lee, Sun-Ho Lee, Jong-Soo Choi (1999)

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DOI: 10.1109/ICIP.1999.817286

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-08

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Sangkeun Lee, Sun-Ho Lee, Jong-Soo Choi:
Depth Measurement Using Frequency Analysis with an Active Projection. ICIP (3) 1999: 906-909

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