Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches."

Jonathan Lueke et al. (2005)

> Home

Details and statistics

DOI: 10.1109/ICMENS.2005.17

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/icmens/LuekeQMC05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icmens/LuekeQMC05
Jonathan Lueke, Noor Al Quddus, Walied A. Moussa, Aman Chahal:
A Parametric Study of Thermal Effects on the Reliability of RF MEMS Switches. ICMENS 2005: 30-31

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.