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"Detection and Measurement of Thin Dielectric Layers Using Reflection of ..."

Nicholas Bowring, John G. Baker, John F. Alder (2007)

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DOI: 10.1109/ICNSC.2007.372818

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Nicholas Bowring, John G. Baker, John F. Alder:
Detection and Measurement of Thin Dielectric Layers Using Reflection of Frequency Scanned Millimetric Waves. ICNSC 2007: 437-442

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