BibTeX record conf/icse/0001WKKB0WKMT20

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@inproceedings{DBLP:conf/icse/0001WKKB0WKMT20,
  author    = {Kui Liu and
               Shangwen Wang and
               Anil Koyuncu and
               Kisub Kim and
               Tegawend{\'{e}} F. Bissyand{\'{e}} and
               Dongsun Kim and
               Peng Wu and
               Jacques Klein and
               Xiaoguang Mao and
               Yves Le Traon},
  editor    = {Gregg Rothermel and
               Doo{-}Hwan Bae},
  title     = {On the efficiency of test suite based program repair: {A} Systematic
               Assessment of 16 Automated Repair Systems for Java Programs},
  booktitle = {{ICSE} '20: 42nd International Conference on Software Engineering,
               Seoul, South Korea, 27 June - 19 July, 2020},
  pages     = {615--627},
  publisher = {{ACM}},
  year      = {2020},
  url       = {https://doi.org/10.1145/3377811.3380338},
  doi       = {10.1145/3377811.3380338},
  timestamp = {Sun, 02 Oct 2022 16:06:28 +0200},
  biburl    = {https://dblp.org/rec/conf/icse/0001WKKB0WKMT20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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