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"Concolic testing for high test coverage and reduced human effort in ..."

Yunho Kim et al. (2019)

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DOI: 10.1109/ICSE-SEIP.2019.00024

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-29

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/icse/KimLBK19
Yunho Kim, Dongju Lee, Junki Baek, Moonzoo Kim:
Concolic testing for high test coverage and reduced human effort in automotive industry. ICSE (SEIP) 2019: 151-160

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