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"Aspect-based On-the-Fly Testing Technique for Embedded Software."

Jong-Phil Kim, Jin-Soo Park, Jang-Eui Hong (2012)

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DOI: 10.5220/0004081503750380

access: closed

type: Conference or Workshop Paper

metadata version: 2017-12-14

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  dblp key:
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Jong-Phil Kim, Jin-Soo Park, Jang-Eui Hong:
Aspect-based On-the-Fly Testing Technique for Embedded Software. ICSOFT 2012: 375-380

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