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"Reliability Assessment of Optoelectronic Systems with Stochastic ..."

Minh-Tuan Truong et al. (2019)

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DOI: 10.1109/ICSRS48664.2019.8987697

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-08

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Minh-Tuan Truong, Phuc Do, Laurent Mendizabal, Benoît Iung:
Reliability Assessment of Optoelectronic Systems with Stochastic Interactions under Accelerated Degradation Testing. ICSRS 2019: 218-223

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