"A Theoretical Framework for Understanding Mutation-Based Testing Methods."

Donghwan Shin, Doo-Hwan Bae (2016)

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DOI: 10.1109/ICST.2016.22

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Donghwan Shin, Doo-Hwan Bae:
A Theoretical Framework for Understanding Mutation-Based Testing Methods. ICST 2016: 299-308

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