"A Unified Framework for Defect Data Analysis Using the MBR Technique."

Venkata U. B. Challagulla, Farokh B. Bastani, I-Ling Yen (2006)

Details and statistics

DOI: 10.1109/ICTAI.2006.23

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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