"Efficient Wafer Defect Patterns Recognition Using Deep Convolutional ..."

M. M. Manjurul Islam, Cormac McAteer, Girijesh Prasad (2023)

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DOI: 10.1109/CAI54212.2023.00102

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-14

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M. M. Manjurul Islam, Cormac McAteer, Girijesh Prasad:
Efficient Wafer Defect Patterns Recognition Using Deep Convolutional Neural Network. CAI 2023: 220-221

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