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"Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays."

Struan Gray, Stefan Axelsson (2019)

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DOI: 10.1007/978-3-030-28752-8_12

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-08

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Struan Gray, Stefan Axelsson:
Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays. IFIP Int. Conf. Digital Forensics 2019: 219-237

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