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"Timed-Event-State-Based Diagnoser for Manufacturing Systems."
Moamar Sayed Mouchaweh et al. (2006)
- Moamar Sayed Mouchaweh, Alexandre Philippot
, Véronique Carré-Ménétrier, Bernard Riera
:
Timed-Event-State-Based Diagnoser for Manufacturing Systems. BASYS 2006: 415-424
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