"DCP-Net: The Defect Detection Method of Industrial Product based on Dual ..."

Zekai Zhang et al. (2023)

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DOI: 10.1109/IJCNN54540.2023.10191285

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type: Conference or Workshop Paper

metadata version: 2024-12-11

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Zekai Zhang, Mingle Zhou, Honglin Wan, Min Li, Gang Li:
DCP-Net: The Defect Detection Method of Industrial Product based on Dual Collaborative Paths. IJCNN 2023: 1-8

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