"A Method for Measuring Process Variations in the FPGA Chip Considering the ..."

Yukiya Miura, Shingo Tsutsumi (2021)

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DOI: 10.1109/IOLTS52814.2021.9486686

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-04

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Yukiya Miura, Shingo Tsutsumi:
A Method for Measuring Process Variations in the FPGA Chip Considering the Effect of Wire Delay. IOLTS 2021: 1-6

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