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"Variation-aware Fault Modeling and Test Generation for STT-MRAM."

Sarath Mohanachandran Nair et al. (2019)

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DOI: 10.1109/IOLTS.2019.8854376

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-31

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  dblp key:
  - conf/iolts/NairBTGT19
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  - https://dblp.org/rec/conf/iolts/NairBTGT19
Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori, Hayk T. Grigoryan, Grigor Tshagharyan:
Variation-aware Fault Modeling and Test Generation for STT-MRAM. IOLTS 2019: 80-83

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