"Defect diagnosis algorithms for a field programmable interconnect network ..."

Gontran Sion, Yves Blaquière, Yvon Savaria (2015)

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DOI: 10.1109/IOLTS.2015.7229837

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Gontran Sion, Yves Blaquière, Yvon Savaria:
Defect diagnosis algorithms for a field programmable interconnect network embedded in a Very Large Area Integrated Circuit. IOLTS 2015: 83-88

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