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"On the analysis of wavelet-based approaches for print mottle artifacts."

Ahmed H. Eid, Brian E. Cooper (2014)

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DOI: 10.1117/12.2041035

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-01

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  dblp key:
  - conf/iqsp/EidC14
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Ahmed H. Eid, Brian E. Cooper:
On the analysis of wavelet-based approaches for print mottle artifacts. IQSP 2014: 901609

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