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"Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped ..."

Tarek Ali et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128337

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-17

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  dblp key:
  - conf/irps/AliKCRPOLMMLHMK20
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  - https://dblp.org/rec/conf/irps/AliKCRPOLMMLHMK20
Tarek Ali, Kati Kühnel, Malte Czernohorsky, Matthias Rudolph, Björn Pätzold, Ricardo Olivo, David Lehninger, Konstantin Mertens, Franz Müller, Maximilian Lederer, Raik Hoffmann, Clemens Mart, Mahsa N. Kalkani, Philipp Steinke, Thomas Kämpfe, Johannes Müller, Jan Van Houdt, Konrad Seidel, Lukas M. Eng:
Impact of Ferroelectric Wakeup on Reliability of Laminate based Si-doped Hafnium Oxide (HSO) FeFET Memory Cells. IRPS 2020: 1-9

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