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"A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology."

Wafa Arfaoui et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129479

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/ArfaouiBMLMCNS20
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  - https://dblp.org/rec/conf/irps/ArfaouiBMLMCNS20
Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula:
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. IRPS 2020: 1-5

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